Bi-Technology detectorParallel measurement with diode and array, linearity correction of the array through the diode. Online correction of the spectral mismatch of the diode through a(Z) and/or F*.MeasurandsSpectral irradiance (W/(m² nm)), illuminance (lx), dominant wavelength, peak wavelength, center wavelength, centroid wavelength, x, y, u', v', X,Y,Z, delta uv, color temperature, color rendering index (CRI) Ra, R1-R15, Option integrating sphere: in addition spectral flux (W/nm) and luminous flux (lm) Option goniometer: in addition radiant intensity and luminous intensity distributionPhotometerAccuracy class B according to DIN 5032 and CIE No. 69, Accuracy class A for f1', u, f3 and f4 according to DIN 5032 and CIE No. 69Input opticsInput diffuser with cosine corrected field of view (f2 < 3 %)Filter wheel4 positions (open, closed, OD1, OD2). Use for remote dark current measurement and dynamic range extension.BiTec light detectorParallel measurement with diode and array, linearity correction of the array through the diode. Online correction of the spectral mismatch of the diode through a(Z) and/or F*.Processors32bit for device control,16bit for CCD array control, 8bit for photodiode controlInterfacesUSB V2.0, Ethernet (LAN UDP protocol), RS232, RS485Data transferStandard for 2048 float array values via ethernet 30ms, via USB 140msInput Interfaces2x (0 - 25) VDC, 1x optocoupler isolated 5 V / 5 mAOutput Interfaces2x open collector, max. 25 V, max. 500 mATriggeringTrigger input incorporated (different options, rising/falling edge, delayed, etc.)Spectral range280 ~ 1050 nmOptical bandwidth2 nmPixel resolution0.4 nm/pixelNumber of pixels2048Array-TypeHighly sensitive back-thinned CCD chipADC16bit (25 ns instruction cycle time)Dynamic range>9 decadesIntegration time0.1 ~ 6000 msMeasurement rangeseven (7) measurement ranges with transcendent offset correctionPhotometric ADC16bit (25 ns instruction cycle time)Spectral responsivitySpectral responsivity with fine CIE photometric standard matching. On-line improvement of the photometric matching by the measured spectral data of the light source.Measurement range illuminanceMax measureable illuminance value 3E8lx, Noise equivalent illuminance value 1E-1lxCalibrationIlluminance +/- 2.2 % 
